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Discount or Disservice: Discount Usability Analysis--
Evaluation at a Bargain Price or Simply Damaged Merchandise?
Wednesday, 9:00 - 10:30
Organizer
Wayne D. Gray, George Mason University
Panelists
John M. Carroll,
Virginia Polytechnic Institute & State University
Michael E. Atwood, NYNEX Science & Technology
John Long, University College of London
Jakob Nielsen, SunSoft, Inc.
Keith Instone /
instone@acm.org /
95-01-05